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Atom-probe field ion microscopy and its applications / Toshio Sakurai, A. Sakai, H.W. Pickering.
LIBRA QH212.F5 S24 1989
Available from offsite location
- Format:
- Book
- Author/Creator:
- Sakurai, Toshio.
- Series:
- Advances in electronics and electron physics. Supplement ; 20.
- Advances in electronics and electron physics. Supplement ; 20
- Language:
- English
- Subjects (All):
- Field ion microscopes.
- Physical Description:
- vii, 299 pages : illustrations ; 24 cm.
- Place of Publication:
- Boston : Academic Press, [1989]
- Notes:
- Includes indexes.
- Bibliography: pages 275-292.
- ISBN:
- 0120145820
- OCLC:
- 182872982
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