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Proceedings of the ... European Test Conference.
LIBRA TK7874 .E974 1st (1989)
Available from offsite location
- Format:
- Conference/Event
- Journal/Periodical
- Conference Name:
- European Test Conference.
- European Design-for-Test Workshop.
- Language:
- English
- Subjects (All):
- Integrated circuits--Testing--Congresses.
- Integrated circuits.
- Semiconductors--Testing--Congresses.
- Semiconductors.
- Semiconductors--Testing.
- Automatic test equipment--Congresses.
- Automatic test equipment.
- Genre:
- Conference papers and proceedings.
- Physical Description:
- volumes : illustrations ; 28 cm
- Biennial
- 1st (1989)-
- Other Title:
- ETC
- Place of Publication:
- Washington, D.C. : IEEE Computer Society Press, 1989-
- Notes:
- Held biennially with the IEEE Computer Society Test Technology Technical Committee holding the European Design-for-Test Workshop in the intervening year.
- OCLC:
- 20141059
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