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Annual proceedings, reliability physics.

LIBRA TS173 .R344 10th (1972)-11th (1973)
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Format:
Conference/Event
Journal/Periodical
Contributor:
Institute of Electrical and Electronics Engineers. Electron Devices Group.
IEEE Reliability Group.
Conference Name:
Reliability Physics Symposium.
Language:
English
Subjects (All):
Semiconductors--Reliability--Congresses.
Semiconductors.
Semiconductors--Reliability.
Reliability (Engineering)--Congresses.
Reliability (Engineering).
Integrated circuits--Reliability--Congresses.
Integrated circuits.
Electronics--Reliability--Congresses.
Electronics.
Reliability.
Genre:
Conference papers and proceedings.
Physical Description:
4 volumes : illustrations ; 28 cm
8th (1970)-11th (1973).
Other Title:
IEEE ... reliability physics 1972-1973
Continues:
Reliability Physics Symposium. Presentation abstracts
Continued By:
International Reliability Physics Symposium. Annual proceedings, reliability physics
Place of Publication:
New York : Institute of Electrical and Electronics Engineers, c1971-c1973.
Notes:
Sponsored by: the IEEE Electron Devices Group and the IEEE Reliability Group.
OCLC:
34954759

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