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Annual proceedings, reliability physics.
LIBRA TS173 .R344 12th (1974)-31st (1993)
Available from offsite location
- Format:
- Conference/Event
- Journal/Periodical
- Conference Name:
- International Reliability Physics Symposium.
- Language:
- English
- Subjects (All):
- Semiconductors--Reliability--Congresses.
- Semiconductors.
- Semiconductors--Reliability.
- Reliability (Engineering)--Congresses.
- Reliability (Engineering).
- Integrated circuits--Reliability--Congresses.
- Integrated circuits.
- Electronics--Reliability--Congresses.
- Electronics.
- Reliability.
- Genre:
- Conference papers and proceedings.
- Physical Description:
- 20 volumes : illustrations ; 28 cm
- 12th (1974)-31st (1993).
- Other Title:
- Reliability physics
- Continues:
- Reliability Physics Symposium. Annual proceedings, reliability physics
- Continued By:
- International Reliability Physics Symposium. IEEE international reliability physics proceedings
- Place of Publication:
- New York : Institute of Electrical and Electronics Engineers, c1974-1993.
- Notes:
- Sponsored by: the IEEE Electron Devices Group and the IEEE Reliability Group, 1974-1975; by the IEEE Electron Devices Society and the IEEE Reliability Group, 1976-1978; by the IEEE Electron Devices Society and the IEEE Reliability Society, 1979-1993.
- OCLC:
- 186661658
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