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Temperature and energy dependence of the introduction and annealing rates of electron-induced defects in n- and p-type silicon.
LIBRA Microfilm P38:1964
Available from offsite location
LIBRA 548.85 N859
Available from offsite location
LIBRA 378.748 POPM1964.92
Available from offsite location
- Format:
- Book
- Manuscript
- Microformat
- Thesis/Dissertation
- Author/Creator:
- Novak, Robert Leonard.
- Language:
- English
- Subjects (All):
- Metallurgical Engineering--Penn dissertations.
- Penn dissertations--Metallurgical Engineering.
- Local Subjects:
- Metallurgical Engineering--Penn dissertations.
- Penn dissertations--Metallurgical Engineering.
- Physical Description:
- xi, 89 numbered l. : diagrams ; 29 cm
- Production:
- [Philadelphia], 1964.
- Notes:
- Thesis (Ph.D. in Metallurgical Engineering)--Graduate School of Arts and Sciences, University of Pennsylvania, 1964.
- Bibliography: l. x-xi.
- OCLC:
- 244991471
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