2 options
Damage in integrated circuits due to electromagnetic coupling.
LIBRA TK7874 .A88
Available from offsite location
LIBRA 378.748 POS1967.144
Available from offsite location
- Format:
- Book
- Manuscript
- Thesis/Dissertation
- Author/Creator:
- Assael, David.
- Language:
- English
- Subjects (All):
- Penn theses--Engineering.
- Engineering--Penn theses.
- Local Subjects:
- Penn theses--Engineering.
- Engineering--Penn theses.
- Physical Description:
- vi, 50 numbered l. : illustrations ; 29 cm
- Production:
- [Philadelphia], 1967.
- Notes:
- Thesis (M.S. in Engineering)--Graduate School of Arts and Sciences, University of Pennsylvania, 1967.
- Bibliography: l. 45.
- OCLC:
- 79125328
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