Proceedings / International Test Conference.

Format:

Conference/Event

Journal/Periodical

Contributor:

IEEE Computer Society. Test Technology Committee.

Institute of Electrical and Electronics Engineers. Philadelphia Section.

Conference Name:

International Test Conference.

Language:

English

Subjects (All):

Integrated circuits--Large scale integration--Congresses.

Integrated circuits.

Integrated circuits--Large scale integration.

Integrated circuits--Testing--Congresses.

Physical Description:

volumes : illustrations ; 28 cm

1983-

Other Title:

IEEE...Test Conference

Continues:

International Test Conference. Digest of papers

Place of Publication:

Silver Spring, Md. : IEEE Computer Society Press, 1983-

Notes:

Each conference has also a distinctive title.

Conferences for 1983- sponsored by the IEEE Computer Society, Test Technology Committee and the IEEE Philadelphia Section.

OCLC:

10342268