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Thin-Film Transistor Reliability.
- Format:
- Book
- Author/Creator:
- Zhang, Meng.
- Language:
- English
- Physical Description:
- 1 online resource (353 pages)
- Edition:
- 1st ed.
- Place of Publication:
- Sharjah : Bentham Science Publishers, 2025.
- Summary:
- Thin-Film Transistor Reliability provides a comprehensive analysis of the reliability challenges in thin-film transistors (TFTs), essential components in modern electronics. Covering topics from fundamental structures to degradation mechanisms, this book equips researchers and engineers with the tools to assess, analyze, and improve TFT reliability. The book systematically explores key reliability concerns, including performance characterization, defect states, voltage stress effects, circuit-level degradation, and environmental influences. Advanced reliability analysis methods and practical improvement strategies are also discussed, offering insights into future developments. Key Features:- In-depth discussion of TFT degradation mechanisms and reliability concerns.- Comprehensive analysis techniques, including transfer curve and noise analysis.- Effects of DC/AC voltage stress, self-heating, and environmental factors.- Strategies for enhancing TFT reliability through structural modifications. Readership:Researchers, engineers, graduate students, and industry professionals in semiconductor electronics and display technology.
- Contents:
- Title
- Copyright
- End User License Agreement
- Contents
- Foreword
- Preface
- An Overview of Thin-Film Transistors
- Overview of Reliability Issues in Thin-Film Transistors
- Reliability Analysis Methods for Thin-Film Transistors
- Direct Current Voltage Stress-Induced Degradation in Thin-Film Transistors
- Alternating Current Voltage Stress-Induced Degradation in Thin-Film Transistors
- Circuit-Level Stress-Induced Degradation in Thin- Film Transistors
- Environmental Stress-Induced Degradation in Thin-Film Transistors
- Strategies for Improving Thin-Film Transistor Reliability
- Summary
- Subject Index.
- Notes:
- Description based on publisher supplied metadata and other sources.
- ISBN:
- 981-5322-61-3
- OCLC:
- 1519123689
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