1 option
Characterization of Minerals, Metals, and Materials 2026 : In-Situ Characterization Techniques / edited by Kelvin Yu Xie, Zhiwei Peng, Mingming Zhang, Jian Li, Bowen Li, Sergio Neves Monteiro, Rajiv Soman, Jiann-Yang Hwang, Yunus Eren Kalay, Juan P. Escobedo-Diaz, John S. Carpenter, Shadia Ikhmayies, Eason Chen.
- Format:
- Book
- Author/Creator:
- Xie, Kelvin Yu.
- Series:
- The Minerals, Metals & Materials Series, 2367-1696
- Language:
- English
- Subjects (All):
- Materials--Analysis.
- Materials.
- Metals.
- Building materials.
- Materials Characterization Technique.
- Metals and Alloys.
- Structural Materials.
- Metal-organic Frameworks.
- Local Subjects:
- Materials Characterization Technique.
- Metals and Alloys.
- Structural Materials.
- Metal-organic Frameworks.
- Physical Description:
- 1 online resource (0 pages)
- Edition:
- 1st ed. 2026.
- Place of Publication:
- Cham : Springer Nature Switzerland : Imprint: Springer, 2026.
- Summary:
- The collection focuses on the advancements of characterization of minerals, metals, and materials and the applications of characterization results on the processing of these materials. Advanced characterization methods, techniques, and new instruments are emphasized. Areas of interest include but are not limited to: Extraction and processing of various types of minerals, process–structure– property relationship of metal alloys, glasses, ceramics, polymers, composites, semiconductors, and carbon using functional and structural materials Novel methods and techniques for characterizing materials across a spectrum of systems and processes Characterization of mechanical, thermal, electrical, optical, dielectric, magnetic, physical, and other properties of metals, polymers, and ceramics including battery materials Characterization of structural, morphological, and topographical natures of materials at micro- and nano-scales Characterization of extraction and processing including process development and analysis Advances in instrument development for microstructure analysis and performance evaluation of materials, such as computer tomography (CT), X-ray and neutron diffraction, electron microscopy (SEM, FIB, TEM), and spectroscopy (EDS, WDS, EBSD) techniques 2D and 3D modeling for materials characterization.
- Notes:
- Description based on publisher supplied metadata and other sources.
- ISBN:
- 3-032-13600-8
- 9783032136008
- OCLC:
- 1574119746
The Penn Libraries is committed to describing library materials using current, accurate, and responsible language. If you discover outdated or inaccurate language, please fill out this feedback form to report it and suggest alternative language.