Challenges of decoding data in spectrscopy, reflectometry, X-ray and electron diffraction / Felix N. Chukhovskii, Petr V. Konarev, Vladimir V. Volkov.

Format:

Book

Author/Creator:

Chukhovskii, Felix N., author.

Konarev, Petr V., author.

Volkov, Vladimir V., author.

Language:

English

Subjects (All):

Numerical analysis.

Physical Description:

1 online resource (115 pages)

Place of Publication:

England : Cambridge Scholars Publisher, [2022]

Summary:

This is the first book to present the direct method for solving the inverse problems in the X-ray multicomponent spectroscopy and small-angle X-ray scattering, X-ray diffraction tomography, grazing-incidence small-angle X-ray reflectometry of multilayer structures, and electron multibeam diffraction imaging. It considers the theory of numerical analysis of multivariate additive spectra of non-separable mixtures, and decodes data obtained using the X-ray diffraction tomography technique. The book also discusses the theory of high-resolution X-ray reflectometry (HRXR) of multilayer structures (MLS) based on the modified Parratt relationships for reflection and transmission coefficients and the phase problem in electron structural crystallography.

Contents:

Intro

Table of Contents

Chapter One

Chapter Two

Chapter Three

Chapter Four

Chapter Five.

Notes:

Description based on print version record.

Other Format:

Print version: Chukhovskii, Felix N. Challenges of Decoding Data in Spectroscopy, Reflectometry, X-Ray and Electron Diffraction

ISBN:

9781527586055