Reliability and Maintainability : Problem-Solving With Probability When a Manufacturing Error Creates Defective Computer Chips / Craig Seidelson.

Format:

Book

Author/Creator:

Seidelson, Craig, author.

Rajagopalan, Hari, author.

Language:

English

Subjects (All):

Integrated circuits industry.

Industrial management--Data processing.

Industrial management.

Physical Description:

1 online resource

Other Title:

Reliability and Maintainability

Place of Publication:

[Place of publication not identified] : SAGE Publications, Inc, 2024.

Summary:

In this scenario, students are introduced to a computer chip manufacturer, SiliconTech Solutions (STS). The information provided includes details about manufacturing defects over time. Students determine expected level of chip defects at 99% confidence as well as the probability of finding defects. At the start of this work, students should be familiar with the concepts of binomial distributions, normal distributions, the empirical rule, and exponential distributions as well as use of the =BINOMDIST and =EXPONDIST functions in Excel. Alternatively, these methodologies can be taught using the information provided.By the end of the Data Challenge, students should be able to calculate binomial probability and the expected value of a binomial distribution at a defined level of confidence. In the second phase of their work students can apply an exponential distribution to determine if a machine sampling plan can ensure that 99% of defective parts are detected.

Notes:

Description based on publisher supplied metadata and other sources.

ISBN:

1-0719-7454-8

9781071974544

OCLC:

1463993563