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Entwicklung eines Röntgenmikroskops für Photonenenergien von 15 keV bis 30 keV
- Format:
- Book
- Author/Creator:
- Marschall, Felix
- Series:
- Schriften des Instituts für Mikrostrukturtechnik am Karlsruher Institut für Technologie / Hrsg.: Institut für Mikrostrukturtechnik
- Language:
- German
- Physical Description:
- 1 online resource (IX, 126 p. p.)
- Place of Publication:
- KIT Scientific Publishing 2014
- Language Note:
- German
- Summary:
- In many research areas X-rays are used for analysis. In X-ray full field microscopy a high resolution is achievable independent of the source properties by using imaging lenses. With an objective lens with 100 mm focal length a theoretical resolution of 60nm is achievable at 30 keV. In Experiments a resolution of 200 nm for a field of view of 80 µm
- ISBN:
- 1000043064
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