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Characterization of Terahertz emission from high resistivity Fe-doped Bulk Ga0.69In0.31As based photoconducting antennas : doctoral thesis accepted by Rensselaer Polytechnic Institute, Troy, USA / Suranjana Sengupta.

Springer Nature - Springer Physics and Astronomy eBooks 2011 English International Available online

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Format:
Book
Thesis/Dissertation
Author/Creator:
Sengupta, Suranjana.
Contributor:
Vasileska, Dragica.
Goodnick, Stephen M.
Series:
Springer theses.
Springer theses, 2190-5053
Language:
English
Subjects (All):
Submillimeter waves.
Optoelectronic devices.
Microwave spectroscopy.
Physical Description:
1 online resource (83 p.)
Edition:
1st ed. 2011.
Place of Publication:
New York : Springer, 2011.
Language Note:
English
Summary:
Terahertz science and technology is attracting great interest due to its application in a wide array of fields made possible by the development of new and improved terahertz radiation sources and detectors. This book focuses on the development and characterization of one such source - namely the semi-large aperture photoconducting (PC) antenna fabricated on Fe-doped bulk Ga0.69In0.31As substrate. The high ultrafast carrier mobility, high resistivity, and subpicosecond carrier lifetime along with low bandgap make Ga0.69In0.31As an excellent candidate for PC antenna based THz emitter that can be photoexcited by compact Yb-based multiwatt laser systems for high power THz emission. The research is aimed at evaluating the impact of physical properties of a semi-large aperture Ga0.69In0.31As PC antenna upon its THz generation efficiency, and is motivated by the ultimate goal of developing a high-power terahertz radiation source for time-domain terahertz spectroscopy and imaging systems. This Doctoral Thesis has been accepted by Rensselaer Polytechnic Institute, Troy, USA.
Contents:
Introduction
Generation of Picosecond Terahertz pulses
Ultrafast Spectroscopy
Experimental Techniques
Experimental Results
Conclusions and Future Outlook.
Notes:
Description based upon print version of record.
Ph. D. Rensselaer Polytechnic Institute 2010
Includes bibliographical references.
ISBN:
1-4419-8198-5
OCLC:
745004957

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