Uniting Electron Crystallography and Powder Diffraction / edited by Ute Kolb, Kenneth Shankland, Louisa Meshi, Anatoly Avilov, William I.F David.

Format:

Book

Conference/Event

Contributor:

Kolb, Ute., Editor.

Shankland, Kenneth., Editor.

Meshi, Louisa, 1977- Editor.

Avilov, Anatoly., Editor.

David, William I.F., Editor.

Conference Name:

NATO Advanced Study Institute on Uniting Electron Crystallography and Powder Diffraction (2011 : Erice, Italy)

NATO Advanced Study Institute on Uniting Electron Crystallography and Powder Diffraction

Series:

NATO Science for Peace and Security Series B: Physics and Biophysics, 1874-6535

Language:

English

Subjects (All):

Crystallography.

Materials--Analysis.

Materials.

Materials science.

Crystallography and Scattering Methods.

Characterization and Analytical Technique.

Materials Science.

Local Subjects:

Crystallography and Scattering Methods.

Characterization and Analytical Technique.

Materials Science.

Physical Description:

1 online resource (XIII, 434 p.)

Edition:

1st ed. 2012.

Place of Publication:

Dordrecht : Springer Netherlands : Imprint: Springer, 2012.

Language Note:

English

Summary:

The polycrystalline and nanocrystalline states play an increasingly important role in exploiting the properties of materials, encompassing applications as diverse as pharmaceuticals, catalysts, solar cells and energy storage. A knowledge of the three-dimensional atomic and molecular structure of materials is essential for understanding and controlling their properties, yet traditional single-crystal X-ray diffraction methods lose their power when only polycrystalline and nanocrystalline samples are available. It is here that powder diffraction and single-crystal electron diffraction techniques take over, substantially extending the range of applicability of the crystallographic principles of structure determination. This volume, a collection of teaching contributions presented at the Crystallographic Course in Erice in 2011, clearly describes the fundamentals and the state-of-the-art of powder diffraction and electron diffraction methods in materials characterisation, encompassing a diverse range of disciplines and materials stretching from archeometry to zeolites. As such, it is a comprehensive and valuable resource for those wishing to gain an understanding of the broad applicability of these two rapidly developing fields.

Contents:

Preface

Part 1 – Powder Diffraction

Powder Diffraction: By Decades

Rietveld Refinement

Structure Solution - an Overview

Inorganic Materials

Organic Compounds

Laboratory X-ray Diffraction

Synchrotron X-Ray Powder Diffraction

Ultra Fast Powder Diffraction

Taking it to Extremes – Powder Diffraction at Elevated Pressures.-Structure Solution by Charge Flipping

Structure Solution: Global Optimisation Methods

Proteins and Powders: Technical Developments

Proteins and Powders: An Overview

Parametric Powder Diffraction

Powder Diffraction + Computational Methods

Information on Imperfections

Pair Distribution Function Technique: Principles and Methods

Debye Analysis

Quantitative Phase Analysis

Quantifying amorphous phases

Quantitative phase analysis: method developments

Texture - an Overview

The future of powder diffraction is 2-D

Part 2 - Electron crystallography

Electron Crystallography – New methods to explore Structure and Properties of the Nano World

Image formation in the Electron Microscope

Models for Precession Electron Diffraction

Structure Solution using HRTEM

Combination of X-ray Powder Diffraction, Electron Diffraction and HRTEM data

Automated Electron Diffraction Tomography

Automated Quantitative 3D Electron Diffraction Rotation Tomography

Introduction to ADT/ADT3D

Electrostatic Potential determined from Electron Diffraction Data

Domino Phase Retrieval Algorithm for Structure Solution

LARBED: Exploring the 4th dimension in Electron Diffraction

Shadow Imaging for Charge Distribution Analysis

Electron Diffraction of Protein 3D Nanocrystals

Parallel-beam Diffraction and Direct Imaging in an aberration-corrected STEM.-Electron diffraction of commensurately and incommensurately modulated Materials

Detection of Magnetic Circular Dichroism using TEM and EELS

Index.-.

Notes:

Bibliographic Level Mode of Issuance: Monograph

Includes bibliographical references and index.

ISBN:

94-007-5580-5

OCLC:

1066193734