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Recombination lifetime measurements in silicon
- Format:
- Book
- Language:
- English
- Subjects (All):
- Semiconductors--Testing--Congresses.
- Semiconductors.
- Service life (Engineering)--Congresses--Forecasting.
- Service life (Engineering).
- Electronic measurements--Congresses.
- Electronic measurements.
- Place of Publication:
- [Place of publication not identified] ASTM 1998
- Language Note:
- English
- Notes:
- Bibliographic Level Mode of Issuance: Monograph
- ISBN:
- 0-8031-5389-9
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