CMOS Chip Design for Reduced Radiated EMI Emissions

Format:

Conference/Event

Author/Creator:

Miller, William E., author.

Conference Name:

International Congress & Exposition (1992-02-24 : Detroit, Michigan, United States)

Language:

English

Physical Description:

1 online resource

Place of Publication:

Warrendale, PA SAE International 1992

Summary:

With the supply and output current (ICC, IOL, IOH) rise times inherent in today's CMOS processes, EMI problems are present even though clock frequency and output voltage switching speed may be slow. The EMI problem is first explained, then basic theory is presented with explanation on how to use it for initial design or to fix a chip so that it has reduced radiated emissions. Actual circuit designs are given which modify the ICC, IOL, and IOH waveforms without destroying functionality or performance. Substrate noise is also reduced to benefit mixing of analog and digital functions on the chip

Notes:

Vendor supplied data

Publisher Number:

920388

Access Restriction:

Restricted for use by site license