In Situ Measurements of Scattering from Contaminated Optics in the Vacuum Ultraviolet Materials and Processes Laboratory, Marshall Space Flight Center Huntsville, AL

Format:

Conference/Event

Author/Creator:

Herren, Kenneth A., author.

Conference Name:

International Conference On Environmental Systems (1990-07-09 : Williamsburg, Virginia, United States)

Language:

English

Physical Description:

1 online resource

Place of Publication:

Warrendale, PA SAE International 1990

Summary:

NASA's In Situ Contamination Effects Facility, Marshall Space Flight Center has been used to measure the time dependence of the angular reflectance from molecularly contaminated optical surfaces in the Vacuum Ultraviolet(VUV). The light scattering measurements are accomplished in situ on optical surfaces in real time during deposition of molecular contaminants. The measurements are taken using non-coherent vacuum ultraviolet (VUV) sources with the predominant wavelengths being the Krypton resonance lines at 1236 and 1600 Angstroms. Detection of the scattered light is accomplished using a set of three solar blind VUV photomultipliers. An in-plane VUV BRDF experiment is described and details of the on-going program to characterize optical materials exposed to the space environment is reported

Notes:

Vendor supplied data

Publisher Number:

901412

Access Restriction:

Restricted for use by site license