Electronic Chassis/PWB Structures: Vibration Response Level Nonlinearities in Reliability Growth Testing

Format:

Conference/Event

Author/Creator:

Rawlings, Richard, author.

Conference Name:

Aerospace Technology Conference & Exposition (1990-10-01 : Long Beach, California, United States)

Language:

English

Physical Description:

1 online resource

Place of Publication:

Warrendale, PA SAE International 1990

Summary:

AbstractThere is evidence that for some types of aircraft electronics equipment, reliability and development growth testing (RDGT) is very effective. However, it has been a slow and difficult process to achieve.The accumulation of vibration damage and wear suffered by electronic equipment test articles during RDGT is a function of the input vibration (random) levels and test durations. Dependence only on design specification requirement input vibration levels and durations to determine RDGT test parameters can lead to excessive overtest.It has been found that excessive accumulations can result from unexpectedly high nonlinear responses.The test article qualification vibration specification requirement levels and durations are also often pivotal in determining the RDGT vibration input level. This approach can lead to rapid overtest where long-duration vibration exposure occurs, such as in RDGT. Damage relationships expressed between these two tests fail to take into account the test article response behavioral nonlinearities.To properly undertake long-duration vibration tests, such as those found in RDGT, it seems essential as the test progresses to maintain knowledge of the ratio:

Notes:

Vendor supplied data

Publisher Number:

901788

Access Restriction:

Restricted for use by site license