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Structural and Thermal Environmental Tests for Electronics: Specification, Purpose, and Selection
- Format:
- Conference/Event
- Author/Creator:
- Herrig, Larry J., author.
- Conference Name:
- Aerospace Technology Conference & Exposition (1990-10-01 : Long Beach, California, United States)
- Language:
- English
- Physical Description:
- 1 online resource
- Place of Publication:
- Warrendale, PA SAE International 1990
- Summary:
- AbstractMany environmental/reliability test requirements are specified for electronic equipment on military/commercial applications. The utilization of the fatigue relationship in MIL-STD-810 can be used to compare the severity of the various tests and aid in the effective evaluation of such requirements
- Notes:
- Vendor supplied data
- Publisher Number:
- 901789
- Access Restriction:
- Restricted for use by site license
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