Low Cost Test Instrumentation for 1553 Based Systems ILC Data Device Corporation

Format:

Conference/Event

Author/Creator:

Glass, Mike, author.

Conference Name:

SAE Aerospace Avionics Equipment and Integration Conference and Exposition (1986-04-24 : Phoenix, Arizona, United States)

Language:

English

Physical Description:

1 online resource

Place of Publication:

Warrendale, PA SAE International 1986

Summary:

In addition to supporting the full repertoire of bus controller functions required for the protocol portion of the R.T. Production Test Plan, the latest generation of low cost 1553 protocol testers provides versatile capabilities for remote terminal simulation and real-time monitoring. When used in conjunction with a very low cost "Noise" (Word Error Rate) tester, such a protocol tester is capable of performing the "Bus Switching" test for dual redundancy. This class of noise tester provides all the necessary hardware and firmware required to perform the Word Error Rate Test of the R.T. Validation (SEAFAC) test, including the noise source. Both instruments are fully controllable by means of the IEEE-488 (GPIB) interface, including DMA capability for the protocol tester

Notes:

Vendor supplied data

Publisher Number:

860859

Access Restriction:

Restricted for use by site license