Portable Tester Rivals Classic ATE Integrated Logistics Support Dept. Grumman Aircraft Systems Div. Grumman Corporation Bethpage, NY

Format:

Conference/Event

Author/Creator:

Andreano, Richard, author.

Conference Name:

SAE Aerospace Technology Conference and Exposition (1986-10-13 : Long Beach, California, United States)

Language:

English

Physical Description:

1 online resource

Place of Publication:

Warrendale, PA SAE International 1986

Summary:

Many organizations must support sophisticated systems in forward areas without the benefit of mainframe high performance, automatic test equipment (ATE). Recent technological advances in software design, integrated circuits, and system architecture have coalesced in a newly designed table-top tester programmed in standard IEEE-716 Atlas. The system, based on a bus architecture, incorporates smart plug-in "instruments-on-a-card" which allow the user to easily reconfigure the tester for a wide range of applications. The system's testing power rivals that of classic mainframe ATE and is capable of testing analog, digital, and hybrid modules

Notes:

Vendor supplied data

Publisher Number:

861657

Access Restriction:

Restricted for use by site license