Development of Reliability Prediction Models for Electronic Components in Automotive Applications IIT Research Institute, Rome, NY

Format:

Conference/Event

Author/Creator:

Binroth, W., author.

Conference Name:

SAE International Congress & Exposition (1984-02-27 : Detroit, Michigan, United States)

Language:

English

Physical Description:

1 online resource

Place of Publication:

Warrendale, PA SAE International 1984

Summary:

This paper discusses models for predicting the reliability of electronic components used in automotive applications. These models were developed on data submitted by members of the Reliability Subcommittee of the Electronic Systems Committee of the SAE and hence the data base used for the development of these models includes no military data (automotive data only). The approach used for developing these models is also presented

Notes:

Vendor supplied data

Publisher Number:

840486

Access Restriction:

Restricted for use by site license