Artificial Intelligence applied to Diagnostics RCA Automated Systems Burlington, MA

Format:

Conference/Event

Author/Creator:

Hartwell, Robert E., author.

Conference Name:

SAE International Congress & Exposition (1985-02-25 : Detroit, Michigan, United States)

Language:

English

Physical Description:

1 online resource

Place of Publication:

Warrendale, PA SAE International 1985

Summary:

Research into the use of AI to enhance the detection of faults and the diagnosis of multiple failure conditions on U.S. Army tactical vehicles is reported. The approach uses existing troubleshooting knowledge (in the form of programmed automated test logic) as the basis for an expert system. A deep model of vehicle systems is incorporated in the diagnostic machine. A pilot model will be implemented on a presently fielded portable microprocessor test system, the Simplified Test Equipment (STE), to demonstrate that the technique is both practical and that it can be realized on a small field portable test set

Notes:

Vendor supplied data

Publisher Number:

850547

Access Restriction:

Restricted for use by site license