Predicting Creep of RIM and RRIM Materials

Format:

Conference/Event

Author/Creator:

Mukerjee, Rahul, author.

Conference Name:

SAE International Congress & Exposition (1982-02-22 : Detroit, Michigan, United States)

Language:

English

Physical Description:

1 online resource

Place of Publication:

Warrendale, PA SAE International 1982

Summary:

The objective of this paper is to present methods for characterizing creep behavior of plastics, in particular, RIM and RRIM materials, using short term testing. The two modes of creep testing discussed are flexural and compressive creep. The techniques were developed based on work with RIM and RRIM materials and provide a quick, accurate way to compare creep behavior and modulus decay for low and high modulus plastics

Notes:

Vendor supplied data

Publisher Number:

820493

Access Restriction:

Restricted for use by site license