Improving the Repeatability of EM Susceptibility Measurements of Electronic Components When Using TEM Cells National Bureau of Standards Boulder, Colorado

Format:

Conference/Event

Author/Creator:

Crawford, M. L., author.

Conference Name:

SAE International Congress & Exposition (1983-02-28 : Detroit, Michigan, United States)

Language:

English

Physical Description:

1 online resource

Place of Publication:

Warrendale, PA SAE International 1983

Summary:

This paper outlines a systematic approach, using a TEM cell, for evaluating the electromagnetic (EM) radiated susceptibility of electronic equipment. The purpose of the paper is to provide guidelines, for those using TEM cells for performing EM susceptibility measurements, to improve the repeatability and, hence, the value of their test results. The paper describes the test setup, details the step-by-step procedures to use in performing susceptibility measurements, and discusses pertinent information related to the range of application and limitations associated with the use of TEM cells

Notes:

Vendor supplied data

Publisher Number:

830607

Access Restriction:

Restricted for use by site license