Next Generation MOS LSI From a Historical Perspective

Format:

Conference/Event

Author/Creator:

Liebler, Jerry, author.

Conference Name:

1980 Automotive Engineering Congress and Exposition (1980-02-25 : Detroit, Michigan, United States)

Language:

English

Physical Description:

1 online resource

Place of Publication:

Warrendale, PA SAE International 1980

Summary:

FABRICATION AND TESTING OF COMPLEX MOS large scale integrated circuitry is changing as the semiconductor industry positions itself for the next generation. Mostek's discussion will highlight some of the advances in technology, production methods, and equipment necessary to the challenges of manufacturing MDS circuits of complexities similar to the 64K RAM. The timing and leadtimes necessary for this technology will be illustrated by historical example. The example will be Mostek's 3870 which in 1977 was the state of the art. This discussion will center around an automotive application now in production and mention the various revision and their timing and impact on manufacturability of the MK3870

Notes:

Vendor supplied data

Publisher Number:

800471

Access Restriction:

Restricted for use by site license