Vehicle Testing for Electromagnetic Compatibility

Format:

Conference/Event

Author/Creator:

Minten, Wayne L., author.

Conference Name:

SAE International Congress & Exposition (1981-02-23 : Detroit, Michigan, United States)

Language:

English

Physical Description:

1 online resource

Place of Publication:

Warrendale, PA SAE International 1981

Summary:

EMC testing for the automobile has taken a new perspective in the past decade. The use of the microprocessor and integrated circuits to solve a multitude of safety, pollution and fuel economy problems has unfortunately resulted in reliability problems caused by RF radiation. The success of a good EMC test capability is an understanding of the RF radiation effects to the automobile and the electronic equipment required to simulate a wide range of radiated environments

Notes:

Vendor supplied data

Publisher Number:

810332

Access Restriction:

Restricted for use by site license