Multi-Channel Modal Testing ZONIC Corporation, Milford, OH

Format:

Conference/Event

Author/Creator:

Deel, James C., author.

Conference Name:

SAE International Congress & Exposition (1982-02-22 : Detroit, Michigan, United States)

Language:

English

Physical Description:

1 online resource

Place of Publication:

Warrendale, PA SAE International 1982

Summary:

The rapidly expanding use of modal analysis techniques creates a need for testing systems which can make the required measurements more efficiently and more accurately than in the past. This paper discusses the design criteria and architecture for a multi-channel FFT processor, and shows how processing up to sixteen parallel input signals can reduce measurement time by an order of magnitude. An example is given which shows the practical value of this increased efficiency

Notes:

Vendor supplied data

Publisher Number:

820192

Access Restriction:

Restricted for use by site license