Automotive ICs - They Work

Format:

Conference/Event

Author/Creator:

Luce, Robert L., author.

Conference Name:

1979 Automotive Engineering Congress and Exposition (1979-02-26 : Detroit, Michigan, United States)

Language:

English

Physical Description:

1 online resource

Place of Publication:

Warrendale, PA SAE International 1979

Summary:

Automotive Integrated Circuits can and will work. Making them work will require substantial commitment on the part of both semiconductor and automotive industries. While there is no choice today but to continue individual part stress - testing to remove potentially defective devices, developing standardized reliability test requirements will make comparative analysis straightforward and minimize testing costs. The importance of minimizing costs may only be over-shadowed by reliability, both of which may overwhelm new processes or designs in the future

Notes:

Vendor supplied data

Publisher Number:

790241

Access Restriction:

Restricted for use by site license