"Next Generation" Means for Detecting Squeaks and Rattles in Instrument Panels MB Dynamics, Incorporated

Format:

Conference/Event

Author/Creator:

Rusen, William M., author.

Conference Name:

SAE Noise and Vibration Conference and Exposition (1997-05-20 : Traverse City, Michigan, United States)

Language:

English

Physical Description:

1 online resource

Place of Publication:

Warrendale, PA SAE International 1997

Summary:

Engineers doing squeak and rattle testing of instrument panels (IP's) have successfully used large electrodynamic vibration systems to identify sources of squeaks and rattles (S&R's). Their successes led to demands to test more IP's, id est, to increase throughput of IP's to reflect the many design, material, and/or manufacturing process changes that occur, and to do so at any stage of the development, production, or QA process. What is needed is a radically different and portable way to find S&R's in a fraction of the time and at lower capital cost without compromising S&R detection results

Notes:

Vendor supplied data

Publisher Number:

972061

Access Restriction:

Restricted for use by site license