Rapid Evaluation of Hermetic Seals in Automotive Microelectronic Packages Using Shearography Oakland Univ

Format:

Book

Conference/Event

Author/Creator:

Hung, Y. Y., author.

Conference Name:

International Congress & Exposition (1996-02-26 : Detroit, Michigan, United States)

Language:

English

Physical Description:

1 online resource cm

Place of Publication:

Warrendale, PA SAE International 1996

Summary:

As the use of electronic devices in automobiles increases, the reliability of such devices is becoming increasingly important. One possible failure is due to leakage resulted from imperfect hermetical seal in mircochips and microelectronic packages. This paper presents an optical technique referred to as shearography for rapid evaluation of hermetics seals. The proposed process of leaking testing is very fast and practical

Notes:

Vendor supplied data

Publisher Number:

960975

Access Restriction:

Restricted for use by site license