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A Smartmos Integrated Circuit for Diagnostic Testing Motorola Automotive Operations
- Format:
- Conference/Event
- Author/Creator:
- Kanner, Jeff, author.
- Conference Name:
- International Congress & Exposition (1995-02-27 : Detroit, Michigan, United States)
- Language:
- English
- Physical Description:
- 1 online resource
- Place of Publication:
- Warrendale, PA SAE International 1995
- Summary:
- A SMARTMOS power integrated circuit has been developed for diagnostic testing in vehicles. The SMARTMOS process is ideal for this application because of its robustness to temperature and voltage extremes. The IC serves as an interface between logic level microcontrollers and battery level testers. It is fully compatible with the ISO 9141 requirement for the interchange of digital information in vehicle diagnostic systems
- Notes:
- Vendor supplied data
- Publisher Number:
- 950222
- Access Restriction:
- Restricted for use by site license
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