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Yield Mapping of Soybeans and Corn Using GPS

SAE Technical Papers (1906-current) Available online

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Format:
Conference/Event
Author/Creator:
Jenane, Chakib, author.
Conference Name:
International Off-Highway & Powerplant Congress & Exposition (1995-09-11 : Milwaukee, Wisconsin, United States)
Language:
English
Physical Description:
1 online resource
Place of Publication:
Warrendale, PA SAE International 1995
Summary:
Data obtained when harvesting with a combine equipped with a yield monitor were used to develop yield maps. A prototype yield monitor was developed that uses a combination of light emitters and receivers mounted in a rectangular frame. The monitor was mounted in the combine in the top of the clean grain elevator. As grain flows through the monitor, a voltage change proportional to light reduction was recorded. This voltage was then correlated to grain flow rate. At the same time, site-specific location was recorded using the global positioning satellites (GPS) system. The location data, yield monitor output, cutting width, and combine forward speed were stored in a spreadsheet format. The data were then used to prepare the yield maps
Notes:
Vendor supplied data
Publisher Number:
952112
Access Restriction:
Restricted for use by site license

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