A Comparison of Physical Layer Devices for Class B and Class C Multiplex Systems. (Using Recommended Practice SAE J1699 for Testing Physical Layer Devices.)

Format:

Conference/Event

Author/Creator:

Zachos, Mark, author.

Conference Name:

International Congress & Exposition (1994-02-28 : Detroit, Michigan, United States)

Language:

English

Physical Description:

1 online resource

Place of Publication:

Warrendale, PA SAE International 1994

Summary:

The objective of this paper is to suggest the advantages of using SAE J1699 tests and methods as a basis for characterization of physical layer devices. This paper will examine some of the commercially available physical layer IC's that could be used to drive Class B and C multiplex networks. Device characteristics such as propagation delays, current consumption, and common mode will be presented. These characteristics could be used to test device performance in Class B and Class C multiplex applications. Also presented will be an introduction to the new SAE J1699 Recommended Practice for multiplex device testing and how J1699 might be used for physical layer device testing

Notes:

Vendor supplied data

Publisher Number:

940138

Access Restriction:

Restricted for use by site license