SAFT Nickel-Cadmium Lifetime and Reliability

Format:

Conference/Event

Author/Creator:

Puig, Olivier, author.

Conference Name:

27th Intersociety Energy Conversion Engineering Conference (1992) (1992-08-03 : San Diego, California, United States)

Language:

English

Physical Description:

1 online resource

Place of Publication:

Warrendale, PA SAE International 1992

Summary:

AbstractThe first part of this document gives the reliability number for SAFT cells. This calculation covers the entire SAFT NiCd cell experience: on ground and on board satellites under LEO and GEO conditions. The second part describes a lifetime model. This model is based on a Weibull distribution and the Arrhenius law, taking into account the following parameters: Temperature, DOD, percentage of failed cells and overcharge current

Notes:

Vendor supplied data

Publisher Number:

929327

Access Restriction:

Restricted for use by site license