Embedded Electronic System Production Tests Automation in Product Development Context Embraer

Format:

Conference/Event

Author/Creator:

de Souza Filho, Deoclides Francisco, author.

Conference Name:

SAE Brasil (1992-05-01 : Sao Paulo, Brazil)

Language:

English

Physical Description:

1 online resource

Place of Publication:

Warrendale, PA SAE International 1992

Summary:

It has been observed that the companies departmentalization causes adverse effects on development of automated production test system for embedded electronic systems. Test systems quality and cost can be improved by promoting an integration between the departments. This way conflicts are reduced and it becomes possible to develop automated test systems since the beginning of the product life-cycle

Notes:

Vendor supplied data

Publisher Number:

921454

Access Restriction:

Restricted for use by site license