A Closed Loop Method for Vehicle Instrument Cluster Test Automation General Motors LLC

Format:

Book

Conference/Event

Author/Creator:

G, G., author.

Contributor:

Ramu, Arunkumar

Shastry, Raghuram

Conference Name:

WCX SAE World Congress Experience (2019-04-09 : Detroit, Michigan, United States)

Language:

English

Physical Description:

1 online resource cm

Place of Publication:

Warrendale, PA SAE International 2019

Summary:

AbstractInstrument Panel Cluster (IPC), is a key ECU in vehicles. As IPC is a visual product, testing the software features of IPC is highly manual effort. Software Testing constitutes for approximately 35% of the total Software Development Life Cycle (SDLC). High focus on quick to market, shorter SDLC coupled with manual validation environment poses a challenge of increasing testing efficiency and improving software quality. This challenge drove the need to investigate a solution to automate the testing process and cut down the huge manual effort that goes into validating an Instrument Panel Cluster (IPC) software. The proposed intrusive and non-intrusive approaches to automate the testing process of IPC software employs a Frame Grabbing technique for the former approach and a Camera based technique for the latter. Both the approaches are robust, reliable, and scalable and covers the major portion of Vehicle Instrument cluster test scenarios. The paper captures the results, advantages and the constraints in the implementation of both the approaches. The comprehensive evaluation of the proposed techniques will help in identifying the right approach for the need, satisfying necessary criteria for automation. The paper aims to provide a best possible solution to optimize the tedious efforts which goes into validating an Instrument Panel Cluster (IPC) software and in turn enables a flawless software delivery within the stipulated timeline

Notes:

Vendor supplied data

Publisher Number:

2019-01-1250

Access Restriction:

Restricted for use by site license