SAE J3168: A Joint Aerospace-Automotive Recommended Practice for Reliability Physics Analysis of Electrical, Electronic and Electromechanical Components DfR Solutions

Format:

Book

Conference/Event

Author/Creator:

Condra, Condra, author.

Contributor:

Hodgson, Keith

Locker, David

McLeish, James

Conference Name:

WCX SAE World Congress Experience (2019-04-09 : Detroit, Michigan, United States)

Language:

English

Physical Description:

1 online resource cm

Place of Publication:

Warrendale, PA SAE International 2019

Summary:

AbstractThis paper describes a joint SAE automotive and aerospace Recommended Practice SAE J3168 now in development to standardize a process for Reliability Physics Analysis. This is a science-based approach to implement Physics-of-Failure research in conducting durability simulations in a Computer Aided Engineering Environment. It is used to calculate failure mechanism susceptibilities and estimate the likelihood of failure and the expected durability life of Electrical, Electronic and Electromechanical components and equipment, due to stresses such as mechanical shock, vibration, temperature cycling, et cetera Reliability Physics Analysis is based on the material science principle of stress driven damage accumulation in materials. The process enables the identification of potential failure risks early in the design phase so that such risks can be designed out in order to efficiently design high reliable and robustness into electronic products. This process is applicable to any type of electronic products and is seen as vital to emerging autonomous and other safety critical vehicular systems

Notes:

Vendor supplied data

Publisher Number:

2019-01-1252

Access Restriction:

Restricted for use by site license