Uncertainty Characterization and Quantification in Product Validation and Reliability Demonstration Tenneco Incorporated

Format:

Conference/Event

Author/Creator:

Wei, Wei, author.

Contributor:

Gao, Litang

Luo, Limin

Start, Michael

Conference Name:

SAE 2016 World Congress and Exhibition (2016-04-12 : Detroit, Michigan, United States)

Language:

English

Physical Description:

1 online resource

Place of Publication:

Warrendale, PA SAE International 2016

Summary:

Product validation and reliability demonstration require testing of limited samples and probabilistic analyses of the test data. The uncertainties introduced from the tests with limited sample sizes and the assumptions made about the underlying probabilistic distribution will significantly impact the results and the results interpretation. Therefore, understanding the nature of these uncertainties is critical to test method development, uncertainty reduction, data interpretation, and the effectiveness of the validation and reliability demonstration procedures. In this paper, these uncertainties are investigated with the focuses on the following two aspects: (1) fundamentals of the RxxCyy criterion used in both the life testing and the binomial testing methods, (2) issues and benefits of using the two-parameter Weibull probabilistic distribution function. Finally, the potential impact of this research on product validation and reliability demonstration are indicated and some recommendations are provided

Notes:

Vendor supplied data

Publisher Number:

2016-01-0270

Access Restriction:

Restricted for use by site license