A BCI-Test Simulation Model for In-Vehicle Equipment DENSO EMC Engineering Service

Format:

Conference/Event

Author/Creator:

Uno, Uno, author.

Contributor:

Hara, Yoichiro

Ichiro, Akahori

Conference Name:

SAE 2016 World Congress and Exhibition (2016-04-12 : Detroit, Michigan, United States)

Language:

English

Physical Description:

1 online resource

Place of Publication:

Warrendale, PA SAE International 2016

Summary:

AbstractIn this paper, consideration is made to create a simulation model of the BCI test method, which is one of the EMC evaluation methods for in-vehicle electronic devices, and an intrinsic model of a BCI probe is provided. Using this model, it is demonstrated that when the impedance of the BCI probe is sufficiently high, the BCI probe serves as a transformer with a winding ratio of 1:1, and the admittance of a line or a load connected to each wire becomes proportional to the magnitude of current flowing in each wire. This model can also be applied when the leakage inductance inside the BCI probe is taken into consideration. The validity of this model is verified by experiment using a jig which can clamp multiple wires.In addition, by using this model, it is demonstrated that the S-parameters for dozens of wires clamped in the BCI probe can be generated using the S-parameter measurement results from when one wire is in the BCI probe

Notes:

Vendor supplied data

Publisher Number:

2016-01-0045

Access Restriction:

Restricted for use by site license