DSM Reliability Concerns - Impact on Safety Assessment Thales Avionics

Format:

Conference/Event

Author/Creator:

Regis, Regis, author.

Contributor:

Berthon, Julie

Gatti, Marc

Conference Name:

SAE 2014 Aerospace Systems and Technology Conference (2014-09-23 : Cincinnati, Ohio, United States)

Language:

English

Physical Description:

1 online resource

Place of Publication:

Warrendale, PA SAE International 2014

Summary:

AbstractFor more than 40 years, Gordon Moore's experimental law has been predicting the evolution of the number of transistors in integrated circuits, thereby guiding electronics developments. Until last years, this evolution did not have any measurable impact on components' quality; but the trend is beginning to reverse. This paper is addressing the impact of scaling on the reliability of integrated circuits. It is analyzing - from both qualitative and quantitative point of view - the behavior of Deep Sub-Micron technologies in terms of robustness and reliability. It is particularly focusing on three basics of safety analyses for aeronautical systems: failure rates, lifetimes and atmospheric radiations' susceptibility

Notes:

Vendor supplied data

Publisher Number:

2014-01-2197

Access Restriction:

Restricted for use by site license