The Uncertainty of Estimated Lognormal and Weibull Parameters for Test Data with Small Sample Size Tenneco Automotive Company, Limited

Format:

Conference/Event

Author/Creator:

Wei, Wei, author.

Contributor:

Lin, Shengbin

Luo, Limin

Yang, Fulun

Conference Name:

SAE 2013 World Congress & Exhibition (2013-04-16 : Detroit, Michigan, United States)

Language:

English

Physical Description:

1 online resource

Place of Publication:

Warrendale, PA SAE International 2013

Summary:

In this paper, the uncertainty of the estimated parameters of lognormal and Weibull distributions for test data with small sample size is investigated. The confidence intervals of the estimated parameters are determined by solving available analytical equations, and the scatters of the estimated parameters with respect to the true values are estimated by using Monte Carlo simulation approaches. Important parameters such as mean, standard deviation, and design curve are considered. The emphasis is on the interpretation and the implication of the obtained shape parameter β of the Weibull distribution function and the design curve obtained from a lognormal distribution function. Finally, the possible impact of this study on the current engineering practice is discussed

Notes:

Vendor supplied data

Publisher Number:

2013-01-0945

Access Restriction:

Restricted for use by site license