Flexible Avionics Testing - From Virtual ECU Testing to HIL Testing dSPACE GmbH

Format:

Conference/Event

Author/Creator:

Himmler, Himmler, author.

Contributor:

Allen, Jace

Moudgal, Vivek

Conference Name:

SAE 2013 AeroTech Congress & Exhibition (2013-09-24 : Montréal, Canada)

Language:

English

Physical Description:

1 online resource

Place of Publication:

Warrendale, PA SAE International 2013

Summary:

Hardware-in-the-loop (HIL) testing is an indispensable tool in the software development process for electronic control units (ECUs) and Logical Replaceable Units (LRUs) and is an integral part of the software validation process for many organizations. HIL simulation is regarded as the tried-and-tested method for function, component, integration and network tests for the entire system. Using the Model based design approach has further enabled improved and faster HIL implementations in recent years.This paper describes the changing requirements for HIL simulation, and how they need to be addressed by HIL technology. It also addresses the challenges faced while setting up a successful HIL system: namely the division of tasks, the total cost of ownership, budget constraints and tough competition and the adaptability of a HIL simulator to new demands. These requirements are discussed using a dSPACE HIL system architecture that was designed from the ground-up to address these needs.The paper also addresses the approach to perform virtual controller testing using the same tools and workflows that can later be used for HIL testing, which improves synergy in the testing processes and increases the speed of deployment for testing with HIL systems. It is also described how a seamless transition from virtual ECU testing to HIL testing can be achieved.Along with covering the standardization of the tools and process for testing, an introduction is given for managing the test environment information and traceability to requirements. A system integration tool is introduced that can tie together the large amounts of common data, models, and test facets that every company faces when implementing these types of test systems

Notes:

Vendor supplied data

Publisher Number:

2013-01-2242

Access Restriction:

Restricted for use by site license