Test Generation Technology for an AUTOSAR Simulation Platform Mentor Graphics Corporation

Format:

Conference/Event

Author/Creator:

Chown, Chown, author.

Conference Name:

SAE 2013 World Congress & Exhibition (2013-04-16 : Detroit, Michigan, United States)

Language:

English

Physical Description:

1 online resource

Place of Publication:

Warrendale, PA SAE International 2013

Summary:

AUTOSAR offers the automotive electronics supply chain a major opportunity for change; however, this change brings a new set of challenges in creating, validating, and integrating the elements needed to make up a correctly functioning automotive system. This particularly imposes new demands on clarity of requirements and effective interaction between supplier and customer.This paper will consider two examples: the use case of a supplier previously delivering a vertically integrated sensor/signal processing/analysis combination on a dedicated electronic control unit (ECU), now providing separate sensor and software component deliverables for another company to integrate; and the challenges faced by that integrator in bringing together many disparate software components into a new consolidated multifunction ECU.The paper looks at the use of a simulation platform-combining full AUTOSAR[1] basic software (BSW), runtime environment (RTE), and test generation technology to enable each of these example use cases-to prove each piece of the solution, early in the design cycle, using common terminology, tools, and environments that will help ensure a well understood process, and the desired results.With the growing emphasis on safety-critical functionality, and additional capabilities in the latest AUTOSAR standard, software test and reliable behavior are ever more critical. This paper will introduce new applications of test generation technology that can potentially help address these important needs

Notes:

Vendor supplied data

Publisher Number:

2013-01-1222

Access Restriction:

Restricted for use by site license