Design Curve Construction Based on Two-Stress Level Test Data Tenneco Incorporated

Format:

Conference/Event

Author/Creator:

Wei, Wei, author.

Contributor:

Konson, Dmitri

Lin, Shengbin

Luo, Limin

Yang, Fulun

Conference Name:

SAE 2012 World Congress & Exhibition (2012-04-24 : Detroit, Michigan, United States)

Language:

English

Physical Description:

1 online resource

Place of Publication:

Warrendale, PA SAE International 2012

Summary:

A design curve, such as a fatigue design S-N curve, is required in engineering design processes. The design curve is usually constructed by analyzing test data, which often exhibit relatively large scatter. For assumed linear test data, two-stress level test plan is commonly used for accelerated life testing (ALT) and subsequent design curve construction. In this paper, based on the two-stress level test plan, a tolerance limit approach is adopted to develop a simple design curve construction procedure. The predicted results from the new method are compared with that of other methods. The advantage of the new method is demonstrated by analyzing the fatigue S-N test data of exhaust components. The determination of minimum sample size is also discussed with a worked table and a graph

Notes:

Vendor supplied data

Publisher Number:

2012-01-0069

Access Restriction:

Restricted for use by site license