My Account Log in

1 option

Efficient Testing and Cost Awareness: Low-Cost versus HIL-System Bosch Engineering GmbH

SAE Technical Papers (1906-current) Available online

View online
Format:
Conference/Event
Author/Creator:
Mueller, Mueller, author.
Contributor:
Langjahr, Petra
Conference Name:
SAE 2012 World Congress & Exhibition (2012-04-24 : Detroit, Michigan, United States)
Language:
English
Physical Description:
1 online resource
Place of Publication:
Warrendale, PA SAE International 2012
Summary:
Developments for innovative systems in engines, hybrid andelectrical vehicles are strongly affected by a high pressure oncosts, short development cycles and high quality requirements.Therefore within the business unit Powertrain Systems of BoschEngineering GmbH (BEG) test environments for SW functions in enginecontrol units (ECU) are selected according to cost and efficiencyaspects as well as availability. Prototype vehicles are veryexpensive and cannot always be provided in time by vehiclemanufacturers. Closed-loop test systems like hardware-in-the-loopsystems (HIL) are alternatives to perform system tests of ECUs in avehicle simulation. We propose to consider the usage of low-costsolutions with reduced costs in many cases. At the same time due tothese saving effects the number of test systems in an organizationcan be increased significantly. This enhances the availability oftesting equipment for engineers.The low-cost approach is equipped with an 8-bit microcontrollerthat governs a small number of analog and digital inputs andoutputs and provides basic CAN functionalities. Test systems likethe proposed μLabCar cover a large part of the use cases fortesting of systems and software. Tests can be performed eithermanually using a graphical user interface or automatically using acommercial tool or a scripting language. The μLabCar could also becontrolled remotely via the company network - an advantage that isvery useful for distributed development teams, e.g., forcooperation with subsidiaries in Europe, Asia and the US.The authors discuss why, when and under which boundaryconditions simple low-cost test systems are a good alternative interms of economy and quality compared to other test systems likefull HIL systems
Notes:
Vendor supplied data
Publisher Number:
2012-01-0933
Access Restriction:
Restricted for use by site license

The Penn Libraries is committed to describing library materials using current, accurate, and responsible language. If you discover outdated or inaccurate language, please fill out this feedback form to report it and suggest alternative language.

Find

Home Release notes

My Account

Shelf Request an item Bookmarks Fines and fees Settings

Guides

Using the Find catalog Using Articles+ Using your account