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Low Cost Development Strategy for Pre-Compliance Electromagnetic Compatibility (EMC) Tests with a Transverse Electromagnetic (TEM) Cell Melling do Brasil

SAE Technical Papers (1906-current) Available online

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Format:
Conference/Event
Author/Creator:
Bronzeri, Bronzeri, author.
Contributor:
de C. Meira, Joao L.
Filho, Ayres P. Andrade
Nascimento, Edson
Conference Name:
21st SAE Brasil International Congress and Exhibition (2012-10-02 : Sao Paulo, Brazil)
Language:
English
Physical Description:
1 online resource
Place of Publication:
Warrendale, PA SAE International 2012
Summary:
During development of electronic products, several measurements are performed to ensure the electromagnetic disturbances are in such levels permitted by costumer requirements. Normally these tests are performed in certified laboratories. This usually causes high impact on timing plan and development costs. In order to reduce the time and cost involved on pre-compliance EMC tests, a Transverse Electromagnetic (TEM) cell was used as a tool for fast analysis of proposed design solutions during development of a brushless motor controller. The TEM was used as an Antenna to measure the electromagnetic disturbances (magnetic field) generated by the EUT (Equipment Under Test). A mathematical correlation between the voltage measured using the Antenna (TEM) and results found in a Certified Laboratory are compared and presented
Notes:
Vendor supplied data
Publisher Number:
2012-36-0302
Access Restriction:
Restricted for use by site license

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