More Efficient Testing and Data Utilization in a Large Development Organization General Dynamics/Astronautics

Format:

Conference/Event

Author/Creator:

Seldon, M. R., author.

Conference Name:

SAE World Congress & Exhibition (1964-01-01 : Detroit, Michigan, United States)

Language:

English

Physical Description:

1 online resource

Place of Publication:

Warrendale, PA SAE International 1964

Summary:

A Unified Test Plan combines all tests of the various departmental organizations. This plan has reduced the number of tests required, by combining the requirements of all departments. This has saved time, test specimens, personnel and, therefore, money. The publication of all tests, controlled by a Test Integration group, has enhanced discipline. Test criteria are more analytical, test data more universal in usefulness, and corrective action surer

Notes:

Vendor supplied data

Publisher Number:

640557

Access Restriction:

Restricted for use by site license