Use of the Weibull Distribution in Analyzing Life Test Data from Vehicle Structural Components A. O. Smith Corporation

Format:

Conference/Event

Author/Creator:

LeMense, R. A., author.

Conference Name:

SAE World Congress & Exhibition (1964-01-01 : Detroit, Michigan, United States)

Language:

English

Physical Description:

1 online resource

Place of Publication:

Warrendale, PA SAE International 1964

Summary:

Published material relating to reliability and use of the Weibull distribution has been primarily in the electronics field. This paper is intended to illustrate how some of the same techniques can and have been utilized in analyzing fatigue type data from automotive structural components. Part I consists of a summary of existing theory and techniques, and Part II illustrates use of the theory and techniques

Notes:

Vendor supplied data

Publisher Number:

640623

Access Restriction:

Restricted for use by site license