Parts Failure Rates Resulting from an Operational Reliability Program

Format:

Conference/Event

Author/Creator:

Goggin, Margaret F., author.

Conference Name:

National Aeronautic and Space Engineering and Manufacturing Meeting

Language:

English

Physical Description:

1 online resource

Place of Publication:

Warrendale, PA SAE International 1963

Summary:

This paper presents the parts failure rates which resulted from an operational reliability program conducted on the Central Air Data Computer and Vertical Scale Systems of the F-105D and F-106A and B integrated Instrument System. The rates, in general, compare favorably with those generated as the result of other programs. However, the semiconductor rates are significantly lower than other industry rates. Evidence is presented which indicates that this is primarily due to the 100% incoming inspection procedures employed by Eclipse-Pioneer Div. on all semiconductors

Notes:

Vendor supplied data

Publisher Number:

630402

Access Restriction:

Restricted for use by site license